Electronic coupling is the transfer of energy from one circuit or medium to another. Sometimes it is intentional and sometimes not (crosstalk). I hope that this column, by mixing technology and general observations, is thought provoking and “couples” with your thinking. Most of the time I will stick to technology but occasional crosstalk diversions may deliver a message closer to home.
Testing the Supply Chain
Much the same as the world, test is not simply black or white but varying shades of grey and a jumble of colors. Test has continually responded to semiconductor technology challenges to provide the right solutions. As a result, the organizational placement and “supply chains” for test have rarely been Continue reading “Coupling & Crosstalk: Testing the Supply Chain”
In an effort to reduce the cost-of-test (COT), a number of customers are increasing the parallelism of logic wafer probe cards. However, due to the complexity such as pitch and number of probes, the pricing for these cards is reaching astronomical levels. We do not believe this trend is sustainable, let alone logical. The presentation suggested examples of alternative solutions. It is clear that critical solutions need to be optimized at the test cell, factory, and supply chain level not just at the consumable (probe card) level.
For the last fifteen years the International Technology Roadmap for Semiconductors (ITRS) has been looking fifteen years into the future. Based upon technology requirements and other inputs, ranging from the gate size of transistors to advanced packaging technology, the Test and Test Equipment Technical Working Group (Test TWG) has worked to develop the requirements for test technology and equipment.
The Test TWG is over seventy volunteers with deep technical expertise in test from around the world and from every sized company – Fortune 100 to individual consultants – and every type of company – semiconductor independent device manufacturer (IDM), fabless semiconductor, foundry, outsourced assembly and test (OSAT), automated test equipment (ATE) suppliers, prober, probe card, socket, handler, and more. Through Continue reading “IEEE Semiconductor Wafer Test Workshop 2014 Presentation”
Wow! The Burn-in and Test Strategy (BiTS) Workshop just turned 15! The world of semiconductors has certainly changed over the years. And the BiTS Workshop has kept up with what is “Now & Next” in the burn-in and test of packaged integrated circuits (ICs). These achievements were celebrated in style by the more than three hundred participants at the recently held 2014 BiTS Workshop in Mesa, Arizona.
Cost! Cost! Cost! are the three most important words for 3D semiconductors.
Just like the real estate mantra “location, location, location”, if you don’t have a solution to the cost issues nothing else matters for 2.5/3D integrated circuit (IC) integration and packaging. It is true that, Xilinx is shipping “production” quantities of 2.5D parts and others have sampled 3D parts. However, there are plenty of technical challenges yet to be solved to make 2.5/3D practical in volume production at reasonable cost and yield.
Electronic coupling is the transfer of energy from one circuit or medium to another. Sometimes it is intentional and sometimes not (crosstalk). I hope that this column by mixing technology and general observations is thought provoking and “couples” with your thinking. Most of the time I will stick to technology but occasional crosstalk diversions may deliver a message closer to home.
What’s in a name? A lot! A name itself might not mean much but it can trigger expectations and stereotypes. In the United States we have red states and blue states depending on which political party has the majority vote. Similarly, when someone labels themselves on the basis of their political party affiliation (Republican, Democrat, Libertarian, Independent, etc.) others Continue reading “Coupling & Crosstalk: Name Calling”
As the Burn-in & Test Strategies (BiTS) Workshop 2013 fades into the sunset (queue the music), here is a round-up of the highlights. There were gun fights in the corral as well as technical questions for the presenters. The saloon girls and gunfighters took an edge off of the “geek” factor. This year over three hundred fifty people come to the “Circle BiTS Ranch” (aka the Hilton in Mesa, Arizona) for the premier conference focused on what is new and next for semiconductor test tooling and strategy. Oh, did I mention that the theme this year was Western?