As the Burn-in & Test Strategies (BiTS) Workshop 2013 fades into the sunset (queue the music), here is a round-up of the highlights. There were gun fights in the corral as well as technical questions for the presenters. The saloon girls and gunfighters took an edge off of the “geek” factor. This year over three hundred fifty people come to the “Circle BiTS Ranch” (aka the Hilton in Mesa, Arizona) for the premier conference focused on what is new and next for semiconductor test tooling and strategy. Oh, did I mention that the theme this year was Western?
Michael Huebner, FormFactor, “A Hot Topic: Current Carrying Capacity, Tip Melting and Arcing”:
Power consumption per dynamic random-access memory (DRAM) is increasing to as high as 400 mA or more under normal test conditions. At the same time the number of DRAMs being tested in parallel – and sharing the same power supply – is increasing. Therefore, the risk of current damage to probes is increasing.
No this isn’t a soliloquy to an Apple iPad that is no longer, but a brief tour of the incredible memory, packaging, and system technology that can be found under the hoods of the original iPad and the iPad 2 along with some of the manufacturing and test implications. These devices clearly demonstrate the new paradigm of “More Than Moore“ where scaling of systems and packaging will propel the next wave of growth in electronics beyond the traditional doubling of performance every two years predicted by Moore’s Law. For many in semiconductor packaging and test engineering communities the issues related to More than Moore have been an academic discussion up to now, but clearly the success of the iPad product line shows the current reality for advanced devices and where the future is headed. Apple and their suppliers took huge risks in developing these new technologies in exchange for substantial returns.
There are so many different types of memory technologies that there is an alphabet soup of acronyms. Ever wonder why we have many different memory technologies some long forgotten with more on the horizon? I refreshed my own memory after last week’s IEEE Nano Technology Council presentation on conductive bridge random access memory (CBRAM).