IEEE Semiconductor Wafer Test Workshop 2012 – Session 6 (Tuesday)

Here are the highlights from Session Six “Meet the Challenge” of the 22nd annual IEEE Semiconductor Wafer Test Workshop (SWTW) from Tuesday June 12, 2012.

Robert Stampahar (SV Probe ‐ An Ellipsiz Company) and Wally Haley (Qualcomm), “Meeting the 1st Silicon: An Alternate Approach for Reducing Probe Card Cycles”:

Unlike other devices which can be tested in packaged form using a test socket, wafer level chip scale packages (WLCSP) rely completely on wafer probe cards for test. A load board with a test socket can usually be designed and fabricated quickly enough that the bring up and debug of new silicon designs is not delayed. When using a wafer probe card that contains a multilayer ceramic (MLC) or multilayer organic (MLO) space transformer, the delivery of the probe card is  Continue reading “IEEE Semiconductor Wafer Test Workshop 2012 – Session 6 (Tuesday)”