Full Wafer / 1 Touch Down Test – High Technology Business Development

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Here are the highlights from the Welcome and Session One “Process Improvements for HVM” of the 22nd annual IEEE Semiconductor Wafer Test Workshop (SWTW) from Monday June 11, 2012.

Jerry Broz (SWTW general conference chair) started with several sets of numbers: SWTW attendance (up), semiconductor revenue and wafer statistics (problems). and probe card market (up). The problem with semiconductor statistics are Continue reading “IEEE Semiconductor Wafer Test Workshop 2012 – Welcome & Session 1 (Monday)”