MEMS Testing and Reliability 2012 – Session 2

Can reliability and production testing keep pace with the explosive growth in  microelectromechanical system (MEMS) based product volumes? Soon it will be the rare consumer product that does not include a MEMS device bringing us closer to the possibility of a $1 trillion MEMS market. In order to achieve greater adoption of the technology, cost and quality goals will need to be met through testing and reliability. This was the focus of the MEMS Testing and Reliability 2012 conference produced by MEMS Journal and MicroElectronics Packaging and Test Council (MEPTEC).

Session 2

Mårten Vrånes (Director of Consulting Services, MEMS Journal) in “A Test-centric Approach to MEMS ASIC Development” discussed alternatives to the traditional co-design of the MEMS element and application specific integrated circuit (ASIC). As many MEMS devices require an ASIC to control and/or sense the MEMS element the most logical approach is to design both parts in parallel. However the scope of such a development effort is often beyond the resources – both in terms of talent and funding – for many companies especially startups.

Mr. Vrånes started with the challenges and pitfalls of ASIC development for MEMS devices. There are challenges regardless of Continue reading “MEMS Testing and Reliability 2012 – Session 2”

Change the Rules to Win!

Some consider the many of billions of dollars invested in the semiconductor supply chain to be huge bets on yet to be proven technology and future business. Even if you take a strict view of this as simply business it is possible to learn something from gambling.

The Atlantic tells the fascinating story of how Don Johnson took Atlantic City casinos for $15 M playing blackjack. Last year he won $5 M from Borgata in February, $4 M from Caesars in March, and $6 M from Tropicana in April. This wasn’t luck and he wasn’t card counting. How did he do this and how does this connect to semiconductors and Apple?

Continue reading “Change the Rules to Win!”