IEEE Semiconductor Wafer Test Workshop – Opening Session & Keynote (Sunday)

On Sunday evening June 12th, 2011 Jerry Broz, the general conference chair, opened the IEEE Semiconductor Wafer Test Workshop welcoming us to the 21st year with a combined total attendance of over 5,000. He also briefly highlighted the positives in recent market trend data from the Semiconductor Industry Association (SIA) and VLSIresearch.

Dr. William Chen, Senior Technical Advisor, ASE Group, provided the keynote presentation “Backend to the Front Line”:

Dr. Chen started with Continue reading “IEEE Semiconductor Wafer Test Workshop – Opening Session & Keynote (Sunday)”