Comments for High Technology Business Development

Comment on The Importance of Fundamentals by Daniel

Daniel — Tue, 29 May 2012 01:58:01 +0000

Great post, a very
important message.

Comment on Memory Alphabet Soup by Memory Technology – Off to the Races! « High Technology Business Development

Tue, 17 Apr 2012 15:44:23 +0000

[...] In terms of commercial status, Adesto Technologies is the furthest along with their conductive bridge RAM (CBRAM) according to Michael Kozicki, Professor of Electrical Engineering at Arizona State and Adesto’s Chief Scientist. They are currently shipping a 1 Mbit serial electrically erasable programmable read-only memory (EEPROM) and are building this and other embedded memories with their partner Altis Semiconductor. (I’ve previously written about Adesto’s technology here.) [...]

Comment on iPad Memories by Memory Technology – Off to the Races! « High Technology Business Development

Tue, 17 Apr 2012 15:43:59 +0000

[...] integrated circuits (ICs) otherwise known as “chips“. (For a detailed example, see iPad Memories for my description of the memory contained in an [...]

Comment on iPad Memories by Two Conferences – Two Industries Challenged By Post PC Era « High Technology Business Development

Thu, 15 Mar 2012 18:24:19 +0000

[...] see my post “iPad Memories… or Memory Magic via More Than Moore” for a discussion of the incredible packaging technology of stacked NAND Flash and [...]

Comment on IEEE Semiconductor Wafer Test Workshop – Opening Session & Keynote (Sunday) by Two Conferences – Two Industries Challenged By Post PC Era « High Technology Business Development

Thu, 15 Mar 2012 18:24:01 +0000

[...] dominant computing platform. I started using the “Post PC” term mid-last year after William Chen’s keynote at the IEEE Semiconductor Wafer Test Workshop (SWTW) discussed the proliferation of semiconductor [...]

Comment on Customer Service – the Good, the Bad, and the Ugly by James Forster

James Forster — Sat, 11 Feb 2012 02:01:11 +0000

Wonderful post Ira. Its not about the answering a customers question its about understanding the problem and helping to solve it.
I recently experienced Apple’s policy with the recall of the original iPod nano. I purchased this 6 or 7 years ago when they first came out as a Christmas gift for my son…… roll forward a few years and I get the nano back and load my music etc. Been using it for a few years and a letter shows up from Apple indictaing that the Nano may be recalled due to a potential hazard with the battery. The serial number falls within the range of poteially defective products so I receive a box, prepaid to ship it to Apple.

The Nano is returned to Apple and 2 days before Christmas they send me the replacement – a new 6th generation nano with 6Gb of memory – the original had only 1Gb. I was blown away that Apple took this approach – I have shared tsi story with anyone who listens because it is simply incredible that so long after the warranty ran out they stodd beind there product – no pro-rating of the value, no cost adjustment …. a simple 1 for 1 replacement.

Re the telephone company – I could not agree more. The service model is unsustainable and we watch as one company after another fails. I think a better comedic sketch and one which still makes me laugh is Elaine May and Mike Nichols … Check it out ..

Or perhaps the scene in the movie falling down — I cannot look at a menu and see images of food without thinking about this

Now how do we get those who work for us in the federal government to understand the idea of service whether it is the DMV or any of the the other “agencies”. When we realize that we pay their salaries it just adds insult to the injury.

Comment on Silicon Valley Test Conference – Something New & Overdue by Silicon Valley Test Workshop – 2nd Year “Rocks” « High Technology Business Development

Mon, 28 Nov 2011 23:30:39 +0000

[...] for the second year (with a minor name change), the Silicon Valley Test Workshop is an unpolished gem. Looking past [...]

Comment on Probe Card Cost Drivers from Architecture to Zero Defects by IEEE Semiconductor Wafer Test Workshop – Productivity / COO – Session Nine (Wednesday) « High Technology Business Development

Mon, 17 Oct 2011 21:55:54 +0000

[...] For a summary of my presentation please see here. [...]

Comment on IEEE Semiconductor Wafer Test Workshop – Spring Pin Probing – Session Five (Tuesday) by Ira Feldman

Ira Feldman — Thu, 11 Aug 2011 15:32:25 +0000

@James – my pleasure! As you note, it’s not just what is on the slides but the additional context which I hope to share by my posts. And for some of the presentations, the questions asked by the audience are equally informative.

Comment on IEEE Semiconductor Wafer Test Workshop – Spring Pin Probing – Session Five (Tuesday) by James Forster

James Forster — Thu, 11 Aug 2011 12:14:08 +0000

Ira – Thanks. Was unable to attend so your comments/overview of these and other presentations adds to the slides and helps provide some of the background you only get from being there.