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La Selva Beach (Santa Cruz County)
May you and your family be blessed with health and prosperity in 2011!
Happy Holidays!
May you and your family be blessed with health and prosperity in 2011!
High Technology Business Development
Ira Feldman's Blog
May you and your family be blessed with health and prosperity in 2011!
- My musings and thoughts on high technology, business development, product management and life in general...
RSS links for my blog
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Recent Posts
- Green on the Industrial Scale
- The Importance of Fundamentals
- Change the Rules to Win!
- Memory Technology – Off to the Races!
- Feldman Engineering Update – March 2012
- Two Conferences – Two Industries Challenged By Post PC Era
- Customer Service – the Good, the Bad, and the Ugly
- SEMI ISS – Snapshot of a Wild Ride – Other Coverage
- SEMI ISS – Snapshot of a Wild Ride – Session 2
- SEMI ISS – Snapshot of a Wild Ride – Session 1
- Big Numbers – The Semiconductor Supply Chain
- Think Outside the Box in 2012!
- Silicon Valley Test Workshop – 2nd Year “Rocks”
- Semiconductor Packaging: 2.5D, 3D, and Beyond!
- Semiconductor Wafer Test Technology and Trends: Lessons for MEMS Test Engineers
- IEEE Semiconductor Wafer Test Workshop – Productivity / COO – Session Nine (Wednesday)
- IEEE Semiconductor Wafer Test Workshop – RF Probing – Session Eight (Wednesday)
- IEEE Semiconductor Wafer Test Workshop – High Temp / Extreme Probing – Session Seven (Tuesday)
- IEEE Semiconductor Wafer Test Workshop – Probe Potpourri – Session Six (Tuesday)
- IEEE Semiconductor Wafer Test Workshop – Spring Pin Probing – Session Five (Tuesday)
- IEEE Semiconductor Wafer Test Workshop – High Performance Probing – Session Four (Monday)
- IEEE Semiconductor Wafer Test Workshop – Power Probing – Session Three (Monday)
- IEEE Semiconductor Wafer Test Workshop – Optimization / Process Analysis – Session Two (Monday)
- IEEE Semiconductor Wafer Test Workshop – Probe Challenges – Session One (Monday)
- IEEE Semiconductor Wafer Test Workshop – Opening Session & Keynote (Sunday)
- Probe Card Cost Drivers from Architecture to Zero Defects
- IEEE Nanotechnology Symposium – Session 1 – Energy Generation and Storage
- IEEE Nanotechnology Symposium 2011 – Keynote
- iPad Memories
- Memory Alphabet Soup
Twitter Updates
- Thanks for the RT & mentions: @MEMSGroup @KHLightman @KenHerron 2 hours ago
- .@KenHerron did you see in Inc.? 8 Great #Twitter Tools to Save You Time j.mp/L7Sji7 2 hours ago
- Sergey #Brin finally lets someone else (Gavin #Newsom) Wear #GoogleGlasses #Wired j.mp/KVozCP 17 hours ago
- My pleasure- hope to do it again @memsjournal: "many thanks for attending and live tweeting from our @MEMSJournal Business Forum last week." 1 day ago
- .@KenHerron - have you seen: Pinterest resumes - a way to pin down jobs? #SFChronicle j.mp/JNO9vA 1 day ago
Post Categories
- 2.5D/3D Stacked Integrated Circuits (ICs) (7)
- 3-D Microstructures (1)
- 450 mm wafers (3)
- American Innovation Working Group (1)
- Apple (4)
- Architecture (1)
- Automatic Test Equipment (ATE) (10)
- Batteries (3)
- Bioscience (2)
- Children (1)
- Clean Tech (Green) (6)
- CMOS Imagers (1)
- Coaching (1)
- Competitive Analysis (1)
- Consulting (1)
- Consumer Electronics Society (2)
- Cost of Test (6)
- Data Waves (1)
- Design Cycles (1)
- DRAM (6)
- Economics (5)
- Electric Vehicles (1)
- Energy (2)
- Environment (2)
- European Union (EU) (1)
- Fabs (1)
- Feldman Engineering (1)
- FLASH Memory (8)
- Full Wafer / 1 Touch Down Test (4)
- Fundamentals (1)
- Grand Challenges (2)
- Healthcare (1)
- High Aspect Ratio Structures (1)
- High Frequency (RF) Testing (2)
- High Performance Computing (HPC) (1)
- High Speed Rail (1)
- High Technology Business Development (1)
- High Volume Manufacturing (HVM) (12)
- Home (1)
- IEEE (24)
- Inkjet (1)
- Internet of Things (1)
- Intersolar (1)
- ITO Replacement (2)
- Japan (2)
- Learning (1)
- Load Boards (6)
- Management (5)
- Manufacturing (8)
- Market Analysis (5)
- Marketing (7)
- Medical Devices (2)
- MEMS (8)
- MEMS Investor Journal (1)
- MEPTEC (3)
- Mobile Devices (1)
- Moore's Law (4)
- More than Moore (6)
- Multi Layer Ceramics (MLC) (3)
- My Presentations (5)
- Nanotechnology (11)
- Operations (5)
- Packaging (Semiconductor) (7)
- Photolithography (4)
- Post PC Era (2)
- Printed Circuit Boards (PCB) (11)
- Probe Card Metrology Tools (5)
- Probe Cards (26)
- Product Management (9)
- Project Management (3)
- Quality (3)
- Roll-to-Roll Manufacturing (2)
- SEMI (6)
- SEMICON West (1)
- Semiconductor Capital Equipment (CAPEX) (9)
- Semiconductor Test (24)
- Semiconductor Wafer Test Workshop (23)
- Semiconductors (11)
- Simulation (3)
- Skiing (1)
- Solar (7)
- Space Transformers (4)
- Standards (1)
- Statistical Process Control (SPC) (1)
- Supercomputers (1)
- Teaching (1)
- Teardown / Reverse Engineering (2)
- Test Engineers (5)
- Thin Film (1)
- Through-Silicon Vias (TSV) (3)
- ToThePoint (3)
- Travel (2)
- Uncategorized (2)
- Water (2)
- What's New (1)
- Yield Improvement (2)
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Copyright © 2010-2012 Ira Feldman.
Unauthorized use and/or duplication of this material without express and written permission is strictly prohibited. Excerpts and links may be used, provided that full and clear credit is given to Ira Feldman and this blog with appropriate and specific direction to the original content.
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